Simple single shot IC tests are easily performed by keying in the IC number on the integrated keypad.
Results are displayed instantly. Search feature finds unmarked IC and displays possible functional equivalents.
- 40 pin wide entry ZIF sockets test a broad range of TTL, CMOS Memory, LSI, Interface and other devices (NAND gates to CPUs)
- Identifies unmarked and house coded devices
- Detects intermittent and temperature related faults
- Displays diagnostic information for individual pins