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2450 Keithley Sourcemeter

New
$5,630.00

The 2450 is a 20 watt Sourcemeter from Keithley. Source meter instruments are a type of electronic test equipment that measures and logs precise voltage and current data. Source meters collect information with high accuracy, ideal for current-voltage (I-V) characterization, semiconductor testing, and testing devices with both positive and negative current source values.

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Additional Features:

  • 200V, 1A, 20W SourceMeter Instrument
  • Capabilities of analyzers, curve tracers, and I-V systems at a fraction of their cost
  • Five-inch, high resolution capacitive touchscreen GUI
  • 0.012% basic measure accuracy with 6½-digit resolution
  • Enhanced sensitivity with new 20mV and 10nA source/ measure ranges
  • Source and sink (4-quadrant) operation
  • Four “Quickset” modes for fast setup and measurements
  • Built-in, context-sensitive front panel help
  • Front panel input banana jacks; rear panel input triaxial connections
  • 2450 enhanced SCPI and TSP® scripting programming modes
  • Model 2400 SCPI-compatible programming mode
  • Front panel USB memory port for data/programming/configuration I/O
  • One-Year Factory Warranty

Included Accessories:

  • 8608: High Performance Test Leads
  • USB-B-1: USB Cable, Type A to Type B, 1m (3.3 ft)
  • CS-1616-3: Safety Interlock Mating Connector
  • CA-180-3A-TSP-Link/Ethernet Cable
  • Documentation CD
  • 2450 QuickStart Guide
  • Test Script Builder (CD)
  • KickStart Setup Software (CD)
  • LabVIEW and IVI Drivers (CD)

The Model 2450 is Keithley’s next-generation SourceMeter source measure unit (SMU) Instrument that truly brings Ohm’s law (current, voltage, and resistance) testing right to your fingertips. Its innovative graphical user interface (GUI) and advanced, capacitive touchscreen technology allow intuitive usage and minimize the learning curve to enable engineers and scientists to learn faster, work smarter, and invent easier.

Unlike conventional instruments with dedicated push button technology and small, obscure, limited-character displays, this unit features a five-inch, full-color, high-resolution touchscreen that facilitates ease of use and learning and optimizes overall speed and productivity. A simple menu structure reduces configuration steps by as much as 50 percent and eliminates the cumbersome multi-layer menu structures typically used on soft-key instruments. Built-in, context-sensitive help enables intuitive operation and minimizes the need to review a separate manual. These capabilities combined with its application versatility make the SMU instrument inherently easy to use for basic and advanced measurement applications, regardless of your experience level with SMU instruments.

The 2450 is the SMU for everyone: a versatile instrument, particularly well-suited for characterizing modern scaled semiconductors, nano-scale devices and materials, organic semiconductors, printed electronics, and other small-geometry and low-power devices.

This instrument is the fourth-generation member of Keithley’s award-winning SourceMeter family of SMU instruments and is based on the proven architecture of the Model 2400 SourceMeter SMU Instrument. It offers a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters. This all-in-one instrument can be used as a:

  • Precision power supply with V and I readback 
  • True current source 
  • Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution). 
  • Precision electronic load 
  • Trigger controller

2400 vs 2450 Comparison

Model 2400Model 2450
V-Ranges: 200mV – 200V V-Ranges: 20mV – 200V
I-Ranges: 1µA – 1A I-Ranges: 10nA – 1A
0.012% Basic Accuracy 0.012% Basic Accuracy
Wideband Noise: 4mVrms Typ. Wideband Noise: 2mVrms Typ.
Sweep Types: Linear, Log, Custom, Source-Memory Sweep Types: Linear, Log, Dual Linear, Dual Log, Custom, Source-Memory (2400 SCPI Mode)
5000 Reading Buffer >250,000 Reading Buffer
SCPI Programming 2400 + 2450 SCPI + TSP Programming
GPIB GPIB, USB, Ethernet (LXI)
Front/Rear Banana Jacks Front: Banana Jacks, Rear: Triax

Ease of Use Beyond the Touchscreen

In addition to its five-inch, color touchscreen, the front panel has many features that supplement its speed, user-friendliness, and learnability, including a USB 2.0 memory I/O port, a HELP key, a rotary navigation/control knob, a front/rear input selector button, and banana jacks for basic bench applications. The USB 2.0 memory port supports easy data storing, saving instrument configurations, loading test scripts, and system upgrades. Plus, all front panel buttons are backlit to enhance visibility in low-light environments.

Four “Quickset” modes simplify user setup. With one touch, the instrument can be quickly configured for various operating modes without the need to configure the instrument indirectly for this operation.

Rear panel access to rear-input triax connectors, remote control interfaces (GPIB, USB 2.0, and LXI/Ethernet), D-sub 9-pin digital I/O port (for internal/external trigger signals and handler control), instrument interlock control, and TSP-Link® jacks enables easy configuration of multiple instrument test solutions and eliminates the need to invest in additional adapter accessories.

Convert Raw Data to Information

This unit provides a full plotting and sheet view to display sweeps, measurement data, and charting right on the screen. It also supports exporting to a spreadsheet for further analysis, dramatically improving productivity for research, bench-top testing, device qualification, and debugging.

The instrument incorporates Keithley’s new TriggerFlow triggering system that allows user control of instrument execution. Similar to developing a flow chart, TriggerFlow diagrams are created using four fundamental building blocks:

  • Wait – Waits for an event to occur before the flow continues
  • Branch – Branches when a condition has been satisfied
  • Action – Initiates an action in the instrument, for example, measure, source, delay, set digital I/O, etc.
  • Notify – Notifies other equipment that an event has occurred
TriggerFlow building blocks let users create very simple to very complex triggering models
A TriggerFlow model using a combination of these building blocks can be created from the front panel or by sending remote commands. With the TriggerFlow system, users can build triggering models from very simple to complex with up to 255 block levels. The instrument also includes basic triggering functions, including immediate, timer, and manual triggering.
Unmatched System Integration and Programming Flexibility
When the SMU is integrated as part of a multi-channel I-V test system, the Test Script Processor (TSP®) embedded scripting capability allows test scripts to be run by the instrument, enabling the user to create powerful measurement applications with significantly reduced development times. TSP technology also offers channel expansion without a mainframe. Keithley’s TSP-Link® channel expansion bus, which uses a 100 Base T Ethernet cable, connects multiple 2450 instruments and other TSP instruments such as Keithley’s Series 2600B SourceMeter SMU instruments and Series 3700A Switch/Multimeter systems in a master-slave configuration that behaves as one integrated system. The TSP-Link expansion bus supports up to 32 units per GPIB or IP address, making it easy to scale a system to fit an application’s particular requirements. The smu also includes a standard SCPI programming mode that optimizes the instrument’s new features, as well as a 2400 SCPI mode that provides backwards compatibility with existing 2400 SourceMeter instruments. Not only does this preserve your 2400 investment, but it also eliminates re-work normally associated with upgrading to a new instrument with new capabilities.
With the TSP technology, multiple devices can be tested in parallel to meet the needs of device research, advanced semiconductor lab applications, and even high throughput production test. This parallel testing capability enables each instrument in the system to run its own complete test sequence, creating a fully multithreaded test environment. The number of tests that can be run in parallel can be as high as the number of instruments in the system.
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