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3255B Wayne Kerr Analyzer

New
$9,427.00

The 3255B is a new analyzer from Wayne Kerr. Analyzers are key tools to test electronic equipment in the engineering, medical, automotive, and technological industries. Use analyzers for monitoring the performances of many different types of electronic devices. You may need analyzers for the measurement of components such as audio spectrums, voltages and currents, signals, and frequencies.

 Wayne Kerr 3255B Features:

  • Maximum Frequency 500 kHz
  • 0.1% basic accuracy
  • Z, L, C, Rac, Ø, Q, D, Rdc & Turns Ratio
  • Internal 1 A DC bias current (option)
  • Up to 125A of DC bias current with 5 x 3265B
  • Modes: Impedance, Multi frequency, Bin handler (optional)
  • DC bias current: 1 mA to 1 A-internal (optional)
  • Interface: GPIB (option)
  • Fast measurement speed (up to 20 measurements per second)
  • Straightforward intuitive operation
  • Print test results
  • GPIB control with LabVIEW™ driver

The 3255B range of inductance analyzers are able to accurately characterise devices in a clear and simple manner. The inductance analyzers are available in three versions 3255BL (200 kHz), 3255B (500 kHz) and 3255BQ (1 MHz).

At the design stage of component development it is very important to analyse how components performs under different operating conditions. This includes operation over a range of frequencies, AC drive levels or DC bias currents.

The AC drive level can be set between 1 mV and 10 V. DC bias current can be set from 1 mA to 1 A internally (optional). Using the external 3265B range of DC Bias Units bias currents can be set to a maximum of 25 A.

Printed output of test results
Using the parallel Centronics interface the user can directly print all test results for further analysis and archiving.

In addition, via the optional GPIB interface, the instrument can be controlled from a PC and results can be read back for analysis and storage.

LabVIEW™drivers are available on request or can be downloaded from the web site, www.waynekerrtest.com, providing a base from which a user can develop a specific test application.

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