Additional Features:
- High-resolution DC Parametric Measurements With the 370B (Resolution Down to 1 pA or 2 µV)
- High Voltage and Current Sourcing With the 371B (Up to 3,000 V or 400 A)
- Built-in Cursor Measurements - Dot, Window and Function Line
- Kelvin Sense Measurements
- Sweep Measurement Mode
- Waveform Comparison and Averaging
- Fully Programmable
- 1.44 MB Floppy Drive Stores Setup and Bitmap of Curves
- Direct Hardcopy with Third-party Printer
- Parametric Characterization of Semiconductors
- Failure Analysis
- Data Sheet Generation
- Manufacturing Test
- Process Monitoring and Quality Control
- Incoming Inspection
- Component Matching
The Tektronix 370B provides up to 20 A/2,000 V sourcing capability combined with 1 pA and 50 micro V measurement resolution. The 370B performs DC parametric characterization of integrated circuits, transistors, thyristors, diodes, SCRs, MOSFETs, electro-optic components, solar cells, solid-state relays and other semiconductor devices. It has push button source and measurement configuration so it's easy to change from one test to the next.
| Manufacturer | Tektronix |
|---|---|
| Condition | Used |
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