71603B Agilent Data Analyzer

Used
The 71603B is a Data Analyzer from Agilent. A data analyzer enables serial data analysis for digital hardware. These analyzers help engineers and others investigate all types of digital hardware, monitoring the equipment for things such as comparison and glitch detection, output timing, data stability, and the validity of output data transfers.

Additional Features:

  • Consisting of:
    • 70001A - Mainframe
    • 70004A - Display
    • 70841B - Pattern Generator
    • 70842B - Error Detector
  • Frequency range:
    • Pattern generator
    • Error detector 100 MHz to 3 GHz (extended frequency options are available)
  • Test patterns:
    • PRBS 2^31 - 1, 2^23 - 1, 2^15 - 1
    • 2^10 - 1, 2^7 - 1 User-defined (max) 4 Mbit via 3-1/2 inch disk (MS-DOS® * format)
  • Zero substitution:
    • Pattern length (2^13, 2^11, 2^10, 2^7) - 1 bit
  • Variable mark density ratio on patterns:
    • 2^13, 2^11, 2^10, 2^7
  • Measurements:
    • Error count/ratio, Errored/error-free intervals
  • Clock frequency

The Keysight Agilent HP 71603B, Error Performance Analyzer, accurately characterize your Gbit systems, devices and components including R&D and manufacturing test of lightwave components and sub-assemblies, advanced computer technology and high-capacity communication systems. For transmission systems up to 3 Gb/s, such as datacoms and CATV trunk feeds, the Keysight Agilent HP 71603B and Keysight Agilent HP 71603B Option 807 error performance analyzers (3 and 1.5 Gb/s) provide a range of PRBS and user-defined patterns with versatile triggering facilities. Powerful application software to speed measurement time. The Keysight Agilent HP E4543A Q Factor and Eye Contour application software. Designed to simplify the characterization of high speed optical communication links, automatically calculating the Q figure of merit. Adaptable application software for full functional testing. The Keysight Agilent HP E4544A OC-192/STM-64 application software automatically constructs SONET/SDH frames for functional test of network elements. Features including error and alarm generation plus CID stressing patterns.

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