Additional Features:
- 1 Independent Waveform Channel
- 16-Bit (1/65536) Vertical Resolution
- 200 MS/s Sample Rate
- Up to 16 M Record Length with option 01
- Optional 16/32/48-Bit 100 MHz (CMOS) Digital Data Generator for Mixed-signal Device Testing
- 2, 4 or 6 Digital Marker Outputs
- Channel Internal Independent Noise Generator
- Independent Channel Skew Control
- Independent Channel External Signal ADD-INPUT
- External Clock and External Reference Inputs
Applications
Designing, Testing and Deploying
- Quadrature Digitally Modulated I&Q Signals and Displays
- Mixed (Analog/Digital) Signals
- Stimulus Signals for Imaging Display and Recording Devices (CCD, LCD)
- Enhanced/Corrupted Playback of DSO Captured Signals
- Simulation Waveform Vectors Imported from Mathcad, Matlab, Excel and Others
Network Communications Physical Layer Testing
- ITU-T (E1, E2, E3)
- TI.102 (DS1, DS1A, DS1C)
- Fibre Channel (FCI33E)
- SDH/SONET (OC1/STM0, OC3/STM1)
- D2
- 100Base-TX
The Tektronix AWG410 performs a wide range of modulated (I&Q) and mixed signal simulations (analog & digital) for wireless and wired data communication, in addition to semiconductor device characterization.
The AWG410 is ideal for design or manufacturing test engineers who need to replicate marginal and erroneous mixed signal conditions. The color display, graphical user interface and stand-alone Microsoft Windows-based waveform creating utility supports quick creation, editing and output of custom or imported waveforms.
| Manufacturer | Tektronix |
|---|---|
| Condition | Used |
| Frequency | 100 MHz |
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