Features:
- 12.5 Gb/s
- 100 MHz
- Integrated, calibrated stress generation to address the stressed receiver sensitivity and clock recovery jitter tolerance test requirements for a wide range of standards
- Electrical stressed eye testing
- Tolerance compliance template testing with margin testing
- Integrated eye diagram analysis with BER correlation
Applications:
- Design verification including signal integrity, jitter, and timing analysis
- Design characterization for high-speed, sophisticated designs
- Certification testing of serial data streams and high performance Networking systems
- Design/Verification of high-speed I/O components and systems
- Signal integrity analysis – mask testing, jitter peak, BER contour, jitter map, and q-factor analysis
- Design/Verification of optical transceivers
The Tektronix BSA125C is an analyzer.
| Manufacturer | Tektronix |
|---|---|
| Condition | Used |
| J-MAP | Add Jitter Decomposition SW |
|---|---|
| PCISTR | Add PCIe Gen2 Extended Stress Generation |
| STR | Stressed Signal Generation (includes option ECC, MAP, PL, XSSC, JTOL) |
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