BSA175C Tektronix Analyzer

Used

Features:

  • 17.5 Gb/s
  • 100 MHz
  • Integrated, calibrated stress generation to address the stressed receiver sensitivity and clock recovery jitter tolerance test requirements for a wide range of standards
  • Electrical stressed eye testing
  • Tolerance compliance template testing with margin testing
  • Integrated eye diagram analysis with BER correlation

Applications:  

  • Design verification including signal integrity, jitter, and timing analysis
  • Design characterization for high-speed, sophisticated designs
  • Certification testing of serial data streams and high performance Networking systems
  • Design/Verification of high-speed I/O components and systems
  • Signal integrity analysis – mask testing, jitter peak, BER contour, jitter map, and q-factor analysis
  • Design/Verification of optical transceivers

The Tektronix BSA175C is an analyzer.

More Information
ManufacturerTektronix
ConditionUsed
Options
ECCAdd Error Correction Coding Emulation SW (included in STR)
F2F/2 Jitter Generation at 8G/10.3125G (requires STR)
GSMGenerator Stress Module – Stressed Eye
JTOLAdd Jitter Tolerance Templates SW (included in STR)
MAPAdd Error Mapping Analysis SW (included in STR)
PLAdd Physical Layer Test Suite SW (included in STR)
SFAdd Symbol Filtering option SW (used with STR)
SLDAdd Stressed Live Data option SW
STRStressed Signal Generation (includes option ECC, MAP, PL, XSSC, JTOL)
XSSCExtended Spread Spectrum Clocking (SSC) (included in STR)
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