BSX125 Tektronix Analyzer

Features:

• Pattern Generation and Error Analysis up to 32 Gb/s
• Provides a single solution for Receiver stress testing, debug and compliance
• Test Gen3 and Gen4 standards including PCIe, SAS, and USB3.1 and proprietary standards
• DUT handshaking capability above16 Gb/s supporting RX test requirements for loopback initiation and adaptive link training for key standards such as PCIe
• Protocol-aware pattern generation and error detection supports flexible stimulus response programmability and debugging of handshaking issues.
• Forward error correction (FEC) emulation option supports measurement of BER both before and after error correction for commonly used Reed-Solomon FEC codes.
• Calibration and test automation software available for key standards

Key performance specifications

• Pattern Generation and Error Analysis up to 32 Gb/s
• Optional built-in 4-tap Tx equalization with support for interactive link training
• Protocol-oriented and bit-oriented multi-chain pattern sequencing with enhanced pattern/sequence editor
• User-defined detector pattern matching with stimulus-response feedback
• Patented Error Location Analysis™ goes beyond BER measurement to provide insight into the sources of errors through analysis of correlations and deterministic error patterns
• Optional Forward Error Correction analysis provides for simulation of post-FEC error rate based upon measured error location patterns
• Integrated Eye Diagram Analysis with BER Correlation including Mask Testing, Jitter Peak, BER Contour
• Optional Jitter Map Comprehensive Jitter Decomposition - with Long Pattern (i.e. PRBS-31) Jitter

Applications

• Design verification including signal integrity, jitter, and timing analysis
• Design characterization for high-speed, sophisticated designs
• Design/Verification of high-speed I/O components and systems including DUT handshaking
• Signal integrity analysis – mask testing, jitter peak, BER contour, jitter map, and forward error correction emulation