Additional Features:
- SDH/PDH Test Set
- 52 Mb/s, 155 Mb/s, and 622 Mb/S Transmit and Receive
- BIT Error Rate Testing Including BIP Error Monitoring and Analysis
- Payload Mapping and Demapping
- Tributary Add, Drop and Test
- Pointer Generation and Analysis
- Alarms Generation and Analysis
- DCC and User Channel Access
- APS Testing
- Simple User Interface
- Automatic Setup
- Pass/Fail Testing
- Rugged Modular Design
- Customer Configurable
- Disk Drive: 200 Instrument setups, or 400 hours of results including histories, or 200 Pass/Fail tests on each disk
- IEEE 488.2 and RS-232C
- AutoScan: Graphically presents the incoming signal structure and allows easy instrument setup
- Pass/Fail Testing: Automates following a written test procedure
- TroubleScan: Highlights error, alarms, and defects
- Graphical Displays: For historical trend analysis
- Online Help: For quick assistance with operation
- Disk Drive: For easy storage of instrument setups, Pass/Fail Test and results
Transmit and Receive Rates
- STM-OE, STM-1E (Electrical)
- STM-0, STM-1, STM-4 (Optical)
- 2 Mb/s, 34 Mb/s, 140 Mb/s (Option 36)
- Compliance to ITU-T G.707, G.708, G.709
Generation and Analysis
- Testing of Bit Error Rates including B1, B2, B3, TU BIP, MS FEBE, Path FEBE and Payload
- Complete alarm monitoring and generation
- Measurement: 1 sec to 99 days
- Histograms: 72 Hours with 1 minute resolution; 45 days with 15 minutes resolution
- Measurements with ITU-T analysis according to G.826, G.821, M.2100
Overhead Management
- Section Overhead, Path Overhead and TU Overhead
- Set and View Byte Value: All
- Set and View Byte Trace Message: J1, J2
- Add/Drop: DCCs, F1, F2
Applications
- Network Integrity Testing
- In-service Performance Monitoring
- Overhead Testing
- Tributary Mapping and Demapping
- Tributary Testing
- Stimulus and Response Testing
- Stress Testing
The ITU-T and ANSI standards for SDH/SONET specify requirements for the network element (ADM, multiplexers, terminals, etc.) interfaces. Installation, commissioning, maintenance and repair of the SDH/SONET network involves the challenge of testing to ITU-T and ANSI standards.
The CTS 700 Series is a rugged portable test set designed not only for your current tasks; though its unique architecture, it will grow with you as SDH and SONET grows. When you require additional capabilities such as optical interfaces, jitter analysis, ATM testing, etc., you can add such functionality to your CTS700.
The CTS750 is part of a new generation of test sets combining various different functions in one instrument with the power to go beyond basic testing. The modular nature of the test set allows you to configure the instrument to your needs, without the cost of unwanted built-in capabilities. Starting with a low cost platform which addresses your basic SDH or SONET testing needs, you can expand its capabilities as desired with a growing number of options.
The CTS750 employs innovative hardware technology which reprograms itself, depending on the operational mode. Future demands regarding access and control of particular bytes are easily reprogrammed. Upgrades are distributed by disks.
| Manufacturer | Tektronix |
|---|---|
| Condition | Used |