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P6251 Tektronix Differential Probe

The P6251 is a Differential Probe from Tektronix. A differential probe is an active probe that has two inputs. A negative and positive input along with a ground lead that drives a 50 Ohm cable to transmit the output ot a digital oscilloscope channel.
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P6251 Tektronix Differential Probe

Special Price $4,977.00 Regular Price $5,530.00
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P6251 Tektronix Differential Probe

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Additional Features:

  • Outstanding Electrical Performance
    • 1 GHz and 500 MHz Probe Bandwidth
    • <1 pF Differential Input Capacitance
    • 1 MΩ Differential Input Resistance
    • ±42 V (DC + pk AC) Differential Input Voltage
    • > 18 dB CMRR (at 250 MHz 50X Attenuation)
    • Selectable Bandwidth Limiting Filters
    • DC Reject
  • Versatile DUT Connectivity
    • Small Compact Probe Head for Probing Small Geometry Circuit Elements
    • Straight Pin, Square Pin, Solder Down, Variable Pitch Standard Accessories
    • Robust Design for Reliability
  • Ease-of-Use
    • Provides Automatic Units Scaling and Readout on the Oscilloscope Display
    • TDP1000, TDP0500
      • Connect Directly to the DPO7000, DPO4000, and MSO4000 Series Oscilloscopes Using TekVPI™ Probe Interface (No additional Power Adapters Required)
      • Easy Access to Scope-Displayed Probe Menu for Probe Setup Control and Operating Status Information
      • AutoZero – Zeros Out Output Offset
        P6251, P6250
      • Connect directly to TDS5000 and other TekProbe™ interface oscilloscopes, or to TekConnect® oscilloscopes using TCA-BNC adapter


The TDP1000, TDP0500, P6251, and P6250 High Voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.

Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, P6251, and P6250 High Voltage Differential Probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:

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