Additional Features:
- Bandwith: 6 GHz
- Number of Channels: 4
- Record Length: 250k
- Sample Rate: 20 GS/s
- Max. Vertical Sensitivity: 1 V/div
- Min. Vertical Sensitivity: 10 mV/div
- Type (D/A) Digital
- Down to 70 ps Rise Time
- Jitter Measurements to 0.7 psRMS
- Compliance Mask Tests Supporting a Wide Range of Computer and Datacom Standards
- 32-Bit Serial Trigger for Isolation of Pattern dependent Effects
- Analysis and Networking Functionality
- MultiView Zoom for Rapid Navigation of the Record
- Control Via Classic Direct Controls, Touch-sensitive Color Display or Mouse
- Open Windows Environment
- Built-in Networking
Applications:
- Validation and Characterization of High-speed Digital Designs
- Jitter and Timing Analysis
- Investigation of Transient Phenomena
The TDS6604 oscilloscopes are high-performance solutions for verification, debug and characterization of sophisticated electronic designs. They feature exceptional signal acquisition performance, operational ease and open connectivity to the design environment. Classic analog-style controls, a large touch-sensitive display and graphical menus provide intuitive control. Open access to the Windows operating system enables unprecedented customization and extensibility.
With a 6 GHz bandwidth and 20 GS/s sample rate on 2 channels or 10 GS/s sample rate on 4 channels simultaneously, the TDS6604 provides unmatched signal integrity measurements. High-performance jitter analysis down to 0.7 psRMS is achieved through exceptional trigger and acquisition performance and applied software.
| Manufacturer | Tektronix |
|---|---|
| Condition | Used |
| Channels | 4 |
| Frequency | 6 GHz |
| Record Length | 250 kPts |
| Sampling Rate | 20 GS/s |
| JT3 | Jitter/Timing Analysis |
|---|---|
| JTA | Jitter Analysis |
| RTE | RT-EYE Serial Compliance and Analysis Software |
| SM | Mask Testing with Clock Recovery |