Additional Features:
- Modular BERT platform for physical layer test and characterization
- Modules of various speed classes up to 13.5 Gb/s
- Up to 66 synchronous generator and analyzer channels
- Powerful pattern sequencer to control complex devices PRBS/PRWS2) and memory based patterns
- Delay control input to apply external jitter sources3)
- Integrated clock data recovery to test clock-less interfaces4)
- Comprehensive measurement suite
The ParBERT 81250 is the flexible and scalable physical layer test solution that, based on its modular BERT engine, enables characterization of high-speed multi-port devices in the computer, communications and feeding semiconductor industry.
The modular ParBERT 81250 can be tailored to individual test needs with up to 132 synchronous channels. Different modules are available for the ParBERT 81250 System that cover data generation and analysis from 333 kb/s up to 13.5 Gb/s. Once purchased in a certain configuration ParBERT 81250 can easily be extended to fit future needs protecting your investment.
| Manufacturer | Agilent, HP, Keysight |
|---|---|
| Condition | Used |
- Agilent 81250 Installation Guide
- Agilent 81250 System Programming Guide and SCPI Reference
- Agilent 81250 System User Guide
- Agilent 81250 Users Guide
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