MP1800A Anritsu Signal Analyzer

Features:

• Highly expandable, plug-in, modular design bit error rate tester (BERT)
• Bit Error Rate test from 0.1 Gbit/s to 32.1 Gbit/s; 64.2 Gbit/s with external MUX/DeMUX
• Supports signal integrity analysis for a variety of 100G+ applications
• High speed backplane and interconnect
• High speed chip/device
• Active optical cable
• Optical transceiver modules
• High-quality (12 ps rise/fall time) and low-jitter (8 ps p-p) PPG waveform, up to 3.5 Vp-p
• Jitter tolerance test up to 32.1 Gbit/s
• SJ up to 2000 UI. High modulation frequency SJ up to 1 UI at 250 MHz
• Support generation of dual tone SJ, RJ, BUJ, and SSC
• Half Period Jitter (Even/Odd Jitter)
• Ultra high sensitivity Error Detector (10 mV typical) with embedded clock recovery
• 32.1 Gbit/s 4Tap Emphasis with external MP1825B
• Crosstalk test and skew tolerance test using synchronized multi-channel PPG
• Passive Linear Equalizers for improved EYE opening
• Comprehensive signal analysis including Burst measurement for PON and EDFA loop circuit testing, Bathtub Measurement (TJ, DJ, RJ), Eye Diagram and Eye Margin Measurement
• 32.1 Gbaud 4PAM/8PAM generators and accurate 4PAM BER measurement
• 1 Tbit/s Next Gen. High-Speed Transmission Testing (32G x 32ch)

Applications:  

• High Speed PAM4 BER Measurement Solution
• High Speed Serial Data Test Solutions
• 64G bit/s Signal Integrity solution
• Ultra High Speed Backplane Test Solution - crosstalk, emphasis and skew tolerance test
• 40 Gbit/s Optical Modulation Test Solution - I/Q signal transmission test
• 100G ethernet Device Test Solution - high quality and functional test signals
• Manufacturing Solution for Multiple Optical Modules and High-Speed Connectors - low cost and low power consumption
• Evaluation of PON devices for the burst data

The Anritsu MP1800A Signal Quality Analyzer is a highly expandable, plug-in, modular-type, bit error rate tester (BERT). It incorporates a Pulse Pattern Generator module (PPG) for outputting high-quality, high-amplitude signals, as well as an Error Detector module (ED) with high input sensitivity supporting signal analyses, including burst pattern, Bathtub Jitter and EYE Diagram measurements. Various types of jitter, such as SJ, RJ, BUJ, SSC, etc., can be generated using the built-in jitter modulation source, supporting device Jitter Tolerance tests.