Additional Features:
- 10 MHz to 26.5 GHz
- 2-ports with single source or 4-ports with two built-in sources
- 127 dB system and 132 dB receiver dynamic range, 32,001 points, 200 channels, 15 MHz IF bandwidth
- High output power (+13 dBm) and a wide power sweep range (38 dB)
- Best dynamic accuracy: 0.1 dB compression with +12 dBm input power at the test port
- Low noise floor of -114 dBm at 10 Hz IF bandwidth
Applications:
- S-parameters (CW and pulsed)
- Noise figure
- Gain compression
- Intermodulation and harmonic distortion
- Conversion gain/loss
- True-differential stimulus
- Millimeter-wave
- Material measurements
- Signal integrity
- Antenna test
The Agilent N5222A is the highest-performing microwave network analyzer in the industry for passive and active device test. You can choose from five frequency models, 13.5, 26.5, 43.5, 50, or 67 GHz, and customize your PNA with the just the right level of performance to meet your specific budget and measurement needs. The Agilent HP PNA is used to test a wide variety of passive and active devices such as filters, duplexers, amplifiers and frequency converters. The high-performance characteristics of the PNA make it an ideal solution for these types of component characterizations as well as millimeter-wave, signal integrity and materials measurements. The PNA Series provides high-power sources and the best linear receivers, giving it the most accurate S-parameter measurements with the widest power range in the market.
| Manufacturer | Agilent, HP, Keysight |
|---|---|
| Condition | Used |
| Frequency | 26.5 GHz |
| 007 | Automatic Fixture Removal |
|---|---|
| 008 | Pulsed-RF Measurements |
| 010 | Time-domain measurements |
| 015 | Dynamic Uncertainty for S-Parameter Measurements |
| 020 | Add IF inputs |
| 021 | Add pulse modulator to internal first source |
| 022 | Add pulse modulator to internal second source |
| 025 | Internal pulse generators, Add 4 |
| 028 | Noise figure measurements using standard receivers |
| 029 | Fully-corrected noise-figure measurements to 13.5 GHz |
| 080 | Frequency offset measurements |
| 082 | Scalar calibrated converter measurements |
| 083 | Vector and scalar calibrated converter measurements |
| 084 | Add embedded LO measurements |
| 086 | Gain compression measurements |
| 087 | Intermodulation distortion measurements |
| 088 | Source phase control |
| 089 | Differential and I/Q devices application |
| 090 | Spectrum Analyzer |
| 118 | Fast CW mode |
| 1CM | Rack mount kit for installation without handles |
| 1CP | Rack mount kit for installation with handles |
| 200 | 2 ports, single source |
| 201 | 2-ports, single source, with configurable test set |
| 219 | Add extended power range and bias-tees to 2 port analyzer |
| 224 | Add internal second source, combiner and mechanical switches to 2-port analyzer |
| 301 | Application for use with standard CalPods |
| 302 | Application for use with temperature-characterized CalPods |
| 400 | 4 ports, dual source |
| 417 | 4-ports, dual source, with extended power range |
| 419 | Add extended power range and bias-tees to 4 port analyzer |
| 423 | Add internal combiner and mechanical switches to 4-port analyzer |
| 460 | Integrated true-mode stimulus application |
| 510 | Nonlinear component characterization, full frequency range |
| 514 | Nonlinear X-Parameters |
| 518 | Nonlinear Pulse Envelope Domain |
| 520 | Arbitrary load impedance X-parameters |
| 551 | N-port calibrated measurements |
| WIN7 | Windows 7 |